LaSrAlO₄ Crystal Substrate

Lanthanum strontium aluminate crystal melting temperature from a low temperature until no twinning and phase change, with the high temperature superconductor YBCO have the same structure, <001> plane as compared with other substrate and YBCO <001> lattice mismatch with moderate (2.5 to 3.5%), while the thermal expansion coefficient of the crystal compared to other low crystalline perovskite structure can be deposited at a lower temperature so as to improve the film lattice mismatch and reduce stress.

Parameter

Physical Properties

Preparation methods	Czochralski method
Crystal structure	Tetragonal（ a=3.756Å，c=12.636Å）
Melting point	165°C
Density	5.924g/cm³
Thermal conductivity	8.82W/(m·K)@300K 7.50W/(m·K)@450K
Thermal expansion coefficient	Along a-axis:(7.55±0.02)×10^-6K-1 Along c-axis:(1.71±0.02)×10^-5K-1
Hardness	at<001>:3512MPa at<100>:6349MPa
Color	Colorless-Yellow
purity	0.9999
Dielectric constant	16.8

Main Specification

Orientation	<001>,<100> Tolerance:±0.5degrees, or special orientation
Size	15×15×0.5mm,10×10×0.5mm,10×5×0.5mm, 5×5×0.5mm
Polished	One side or double side polished
Surface roughness	≤5Å
Package	100 clean bags, single or multi-chip wafer box